Routine control of accuracy in silicate rock analysis by X-ray fluorescence spectrometry

Geostandards Newsletter

Volumn 25, Issue 2-3, 2001, Pages 283-291

  Vendemiatto, Maria Aparecida ^a   Enzweiler, Jacinta ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

Accuracy; Major and trace element determination; Quality control; Reference materials; Silicate rock analysis; XRF

Indexed keywords

EID: 0001395199     PISSN: 01505505     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1751-908x.2001.tb00604.x     Document Type: Article

References (12)

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