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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Novel probes for scanning probe microscopy

(1) Oesterschulze, E a

a UNIVERSITY OF KASSEL (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER PROBE; COPLANAR WAVEGUIDE LINES; NOVEL MATERIALS; SAMPLE SURFACE; SCANNING FORCE MICROSCOPY; SCHOTTKY DIODES; SENSOR CONCEPTS; SILICON CANTILEVER; SPECIFIC MATERIALS; TOPOGRAPHY IMAGING;

ATOMIC FORCE MICROSCOPY; COPLANAR WAVEGUIDES; ELECTRIC PROPERTIES; GALLIUM ALLOYS; GALLIUM ARSENIDE; NANOCANTILEVERS; OPTICAL PROPERTIES; PROBES; SCANNING; SCANNING TUNNELING MICROSCOPY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SURFACE PROPERTIES;

MECHANICAL PROPERTIES;

EID: 0001394208 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051089 Document Type: Article

Times cited : (16)

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