Use of microwave plasma torch atomic emission spectrometry for the determination of silicon

Fresenius' Journal of Analytical Chemistry

Volumn 357, Issue 4, 1997, Pages 384-388

  Liang, Feng ^a   Zhang, Hanqi ^a   Jin, Qun ^a   Zhang, Daxin ^a   Lei, Yahu ^a   Jin, Qinhan ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001389440     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050174     Document Type: Article

References (16)

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