Domain wall trapping in controlled submicron ferromagnetic elements

Journal of Applied Physics

Volumn 87, Issue 9 II, 2000, Pages 4727-4729

  Hirohata, A ^a   Xu, Y B ^a   Yao, C C ^a   Leung, H T ^a   Lee, W Y ^a   Gardiner, S M ^a   Hasko, D G ^a   Bland, J A C ^a   Holmes, S N ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001382921     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373140     Document Type: Article

References (8)

1. K. Hong and N. Giordano, Phys. Rev. B 51, 9855 (1995); Europhys. Lett. 36, 147 (1996).
2. K. Hong and N. Giordano, Phys. Rev. B 51, 9855 (1995); Europhys. Lett. 36, 147 (1996).
3. U. Ruediger, J. Yu, S. Zhang, A. D. Kent, and S. S. P. Parkin, Phys. Rev. Lett. 80, 5639 (1998).
4. Y. B. Xu, C. A. F. Vaz, A. Hirohata, C. C. Yao, W. Y. Lee, J. A. C. Bland, F. Rousseaux, E. Cambril, and H. Launois, J. Appl. Phys. 85, 6178 (1999).
5. G. Tatara and H. Fukuyama, Phys. Rev. Lett. 78, 3773 (1997).
6. P. M. Levy and S. Zhang, Phys. Rev. Lett. 79, 5110 (1997).
7. K. L. Babcock, V. B. Elings, J. Shi, D. D. Awschalom, and M. Dugas, Appl. Phys. Lett. 69, 705 (1996).
8. H. T. Leung, A. Hirohata, W. Y. Lee, and J. A. C. Bland (unpublished).