Microscopic nature of Staebler-Wronski defect formation in amorphous silicon

Applied Physics Letters

Volumn 72, Issue 3, 1998, Pages 371-373

  Biswas, R ^a   Pan, B C ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001374901     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120740     Document Type: Article

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