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Review of Scientific Instruments

Volumn 62, Issue 4, 1991, Pages 996-1004

A contactless method for measurement of the critical current density and critical temperature of superconducting films

(3) Claassen, J H a Reeves, M E a Soulen Jr , R J a

a NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001371354 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1141991 Document Type: Article

Times cited : (298)

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- The sample to coil distance is calculated (see Fig. 2) by measuring the ratio of the inductance of the coil pressed against a superconducting film to the inductance of a free-standing coil ([Formula Omitted]). The drop in the inductance ratio inferred from Fig. 10 is higher ([Formula Omitted]) due to shielding by the copper-thermometer block pressed against the backside of the substrate.

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.