Characterization and modeling of the precipitation of the sigma phase in UDIMET 720 and UDIMET 720Li

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 30, Issue 3, 1999, Pages 521-533

  Reed, R C ^a   Jackson, M P ^a   Na, Y S ^a,b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b Korea Institute of Machine and Materials   (South Korea)

Author keywords

Material Transaction; Microstructural Degradation; Rietveld Analysis; Rietveld Method; Sigma Phase

Indexed keywords

HIGH STRENGTH ALLOYS; REACTION KINETICS; RIETVELD ANALYSIS; SINGLE CRYSTALS; SUPERALLOYS; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CRYSTALLOGRAPHIC PARAMETERS; ELECTROLYTIC EXTRACTION; HIGH-STRENGTH; MATERIAL TRANSACTION; MICROSTRUCTURAL DEGRADATION; NICKEL-BASED SUPERALLOYS; NUMERICAL DATA; RIETVELD METHOD; SIGMA PHASE; X- RAY DIFFRACTIONS;

NICKEL ALLOYS;

EID: 0001365483     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-999-0044-6     Document Type: Article

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