True atomic resolution by atomic force microscopy through repulsive and attractive forces

Science

Volumn 260, Issue 5113, 1993, Pages 1451-1456

  Ohnesorge, F ^a   Binnig, G ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001361115     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.260.5113.1451     Document Type: Article

References (0)