Interferometric analysis of resonant Rayleigh scattering from two-dimensional excitons

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 8, 2000, Pages R5109-R5112

  Haacke, S ^a   Schaer, S ^a   Deveaud, B ^a   Savona, V ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001350251     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.R5109     Document Type: Article

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