Room-temperature normal-mode coupling in a semiconductor microcavity utilizing native-oxide AlAl/GaAs mirrors

Applied Physics Letters

Volumn 69, Issue 20, 1996, Pages 3031-3033

  Nelson Jr , T R ^a   Prineas, J P ^a   Khitrova, G ^a   Gibbs, H M ^a   Berger, J D ^a   Lindmark, E K ^a   Shin, J H ^b   Shin, H E ^b   Lee, Y H ^b   Tayebati, P ^c   Javniskis, L ^c  

^a UNIVERSITY OF ARIZONA   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c CoreTek Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001337920     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116829     Document Type: Article

References (21)

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21. This technique was performed at KAIST; identical NMC was seen on an adjacent piece of the sample processed at CoreTek.