Crystal stress dynamics by means of nanosecond time-resolved x-ray diffraction

Applied Physics Letters

Volumn 71, Issue 12, 1997, Pages 1646-1648

  Chen, P ^a   Tomov, I V ^a   Rentzepis, P M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001334063     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120005     Document Type: Article

References (18)

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