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Volumn 55, Issue 7, 1997, Pages 4242-4249

Resonant inelastic soft-x-ray scattering from valence-band excitations in compounds

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EID: 0001329355     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.4242     Document Type: Article
Times cited : (49)

References (43)
  • 29
    • 0003584813 scopus 로고
    • This value is derived by adjusting the energy scale, common for the set of valence-band photoemission spectra reported in Ref. 23, so that this scale for (Formula presented), (Formula presented), and (Formula presented) is in agreement with what was measured for these compounds by different research groups [see, for example, K. W. Goodman and V. E. Henrich, Phys. Rev. B 50, 10 450 (1994).
    • (1994) Phys. Rev. B , vol.50 , pp. 10450
    • Goodman, K.1    Henrich, V.2
  • 32
    • 0000202432 scopus 로고
    • S. W. Robey, L. T. Hudson, C. Eylem and B. Eichorn, Phys. Rev. B 48, 562 (1993)]. The derived value is also consistent with the expectation that in (Formula presented) the chemical potential should be near the bottom of the conduction band as in other tetravalent Ti compounds.
    • (1993) Phys. Rev. B , vol.48 , pp. 562
    • Robey, S.1    Hudson, L.2    Eylem, C.3    Eichorn, B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.