Assessment and modeling of aging in electro-absorption distributed bragg reflector lasers

IEEE Journal of Quantum Electronics

Volumn 37, Issue 11, 2001, Pages 1382-1386

  Ackerman, David A ^a   Johnson, John E ^a   Sung Nee George, Chu ^a   Zhang, Liming ^b   Dean, Eric J ^a   Ketelsen, Leonard J P ^a  

^a AGERE SYSTEMS   (United States)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

Distributed bragg reflector laser; Nonradiative recombination; Reliability testing; Semiconductor laser, wavelength division multiplexing; Wavelength selectable laser

Indexed keywords

EID: 0001323338     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.958350     Document Type: Article

References (10)

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