Defect induced lowering of activation energies at step bands in Co/Cu(100)

Applied Physics Letters

Volumn 72, Issue 8, 1998, Pages 912-914

  Coyle, S T ^a   Scheinfein, M R ^a   Blue, James L ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001322067     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120871     Document Type: Article

References (14)

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