Integrating Time Domain and Input Domain Analyses of Software Reliability Using Tree-Based Models

IEEE Transactions on Software Engineering

Volumn 21, Issue 12, 1995, Pages 945-958

  Tian, Jeff ^a  

^a SOUTHERN METHODIST UNIVERSITY   (United States)

Author keywords

data partitioning; input state; reliability growth models; Software reliability; testing; tree based modeling

Indexed keywords

EID: 0001313875     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/32.489071     Document Type: Article

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