Research and development, competition and innovation pseudo-maximum likelihood and simulated maximum likelihood methods applied to count data models with heterogeneity

Journal of Econometrics

Volumn 79, Issue 2, 1997, Pages 355-378

  Crepon, Bruno ^a   Duguet, Emmanuel ^b  

^a Direction de la Prévision 139 ^*  (France)

^b CREST   (France)

Author keywords

Count data; Externality; Patent; Pseudo maximum likelihood; Research and development; Simulated maximum likelihood

Indexed keywords

EID: 0001309008     PISSN: 03044076     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-4076(97)00027-4     Document Type: Article

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