Information storage using conductance change of Langmuir-Blodgett film and atomic force microscope/scanning tunneling microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1353-1355

  Yano, K ^a   Kuroda, R ^a   Shimada, Y ^a   Shido, S ^a   Kyogaku, M ^a   Matsuda, H ^a   Takimoto, K ^a   Eguchi, K ^a   Nakagiri, T ^a  

^a CANON INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001301055     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589096     Document Type: Article

References (9)

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