Second-harmonic generation at the interface between Si(100) and thin SiO2 layers

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 3, 1998, Pages 1730-1734

  Cundiff, S T ^a,b   Knox, W H ^a   Baumann, F H ^a   Evans Lutterodt, K W ^a   Green, M L ^a  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK INVERSION SYMMETRY; INTERFACE ROUGHNESS; INVERSION SYMMETRY; OFF-AXIS; OFF-AXIS ANGLES; OPTICAL SECOND-HARMONIC GENERATION; SECOND HARMONIC GENERATION; SHG SIGNALS; SI(1 0 0); THIN LAYERS; THREE-FOLD SYMMETRY; X-RAY SCATTERING MEASUREMENTS;

INTERFACES (MATERIALS); NONLINEAR OPTICS; SILICON COMPOUNDS;

HARMONIC GENERATION;

EID: 0001298286     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581292     Document Type: Article

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