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Volumn 82, Issue 5, 1999, Pages 1281-1288

Contact fatigue in silicon nitride

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EID: 0001296081     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1999.tb01908.x     Document Type: Article
Times cited : (36)

References (27)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.