Application of infrared ATR spectroscopy to in situ reaction monitoring

Catalysis Today

Volumn 49, Issue 4, 1999, Pages 411-418

  Wolf, Udo ^a   Leiberich, Ricarda ^a   Seeba, Johann ^a  

^a BAYER AG   (Germany)

Author keywords

Attenuated total reflection (ATR); Horizontal ATR technique; IR ATR spectra; Reaction monitoring

Indexed keywords

EID: 0001292140     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5861(98)00446-5     Document Type: Article

References (7)

1. N.J. Harrick, Internal Reflection Spectroscopy, Harrick Scientific, Ossining, New York.
2. Messerschmidt, US Patent 4 730 882.
3. F.M. Mirabella (Ed.), Internal Reflection Spectroscopy, Dekker, New York, 1993.
4. D.W. Sting, Filed patent application GB 2 228 083 A.
5. W.R. Moser, J.E. Cnossen, A.W. Wang, S.A. Krouse, J. Catal. 95 (1985) 21-32.
6. Z. Dardas, M.G. Süer, Y.H. Ma, W.R. Moser, J. Catal. 159 (1996) 204-211 and references therein.
7. Filed patent application DE 4426944.