The influence of defects on the Ni 2p and O 1s XPS of NiO

Journal of Physics: Condensed Matter

Volumn 4, Issue 40, 1992, Pages 7973-7978

  Uhlenbrock, St ^a   Scharfschwerdt, C ^a   Neumann, M ^a   Illing, G ^b   Freund, H J ^b  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001282870     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/4/40/009     Document Type: Article

References (17)

1. Compositional changes induced by 3.5 keV Ar+ ion bombardment in Ni-Ti oxide systems
2. An XPS study of the Ar+-induced reduction of Ni2+ in NiO and Ni-Si oxide systems
3. Theory of Surface Spin Waves in the Heisenberg Ferromagnet