High accuracy solution to correspondence problem

Electronics Letters

Volumn 36, Issue 11, 2000, Pages 948-951

  Izquierdo, E ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001264444     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20000709     Document Type: Article

References (4)

1. NAYAR, S.K., SANDERSON, A.C., WEISS, L.E., and SIMON, D.D.: 'Specular surface inspection using structured highlight and Gaussian images', IEEE Trans. Robot. Autom., 1990, 6, (2), pp. 208-218
2. KIM, T.H., CHO, T.H., MOON, Y.S., and PARK, S.H.: 'Visual inspection system for the classification of solder joints', Patt. Recog., 1999, 32, pp. 565-575
3. HAYKIN, S.: 'Neural network: a comprehensive foundation' (Prentice Hall, 1999), 2nd edn.
4. SCHOLKOPF, B., SUNG, K., BURGES, C., GIROSI, F., NIYOGI, P., POGIO, T., and VAPNIK, V.: 'Comparing support vector machines with Gaussian kernels to radial basis function classifiers', A.I. Memo 1599