Roughness in surface growth equations

Interfaces and Free Boundaries

Volumn 3, Issue 4, 2001, Pages 465-484

  Blomker, Dirk ^a   Maier Paape, Stanislaus ^a   Wanner, Thomas ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

Author keywords

Additive white and colored noise; Mean interface width; Molecular beam epitaxy; Stochastic partial differential equations; Surface roughness

Indexed keywords

EID: 0001262710     PISSN: 14639963     EISSN: None     Source Type: Journal    
DOI: 10.4171/IFB/49     Document Type: Article

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