Electron impact ionization in a microion trap mass spectrometer

Review of Scientific Instruments

Volumn 70, Issue 10, 1999, Pages 3907-3909

  Kornienko, Oleg ^a   Reilly, Peter T A ^a   Whitten, William B ^a   Ramsey, J Michael ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001262596     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150010     Document Type: Article

References (7)

1. O. Kornienko, P. T. A. Reilly, W. B. Whitten, and J. M. Ramsey, Rapid Commun. Mass Spectrom. 13, 50 (1999).
2. M. J. Charles and G. L. Glish, in Practical Aspects of Ion Trap Mass Spectrometry, Vol. III, edited by R. E. March and J. F. J. Todd (Chemical Rubber, Boca Raton, FL, 1995).
3. B. A. Eckenrode, S. A. McLuckey, and G. L. Glish, Int. J. Mass Spectrom. Ion Processes 106, 137 (1991).
4. J. M. Wells, E. R. Badman, and R. G. Cooks, Anal. Chem. 70, 438 (1998).
5. E. R. Badman, R. C. Johnson, W. R. Plass, and R. G. Cooks, Anal. Chem. 70, 4896 (1998).
6. G. C. Stafford, Jr., P. E. Kelly, J. E. P. Syka, W. E. Reynolds, and J. F. J. Todd, Int. J. Mass Spectrom. Ion Processes 60, 85 (1984).
7. NIST Standard Reference Database 69 - November 1998 Release: NIST Chemistry WebBook.