Enhanced depth resolution in terahertz imaging using phase-shift interferometry

Applied Physics Letters

Volumn 78, Issue 6, 2001, Pages 835-837

  Johnson, Jon L ^a   Dorney, Timothy D ^a   Mittleman, Daniel M ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001259411     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1346626     Document Type: Article

References (13)

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