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Volumn 71, Issue 13, 1997, Pages 1834-1836
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The effect of reactive plasma etching on the transient enhanced diffusion of boron in silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001245995
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.119414 Document Type: Article |
Times cited : (14)
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References (9)
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