Effects of finite drain voltage and finite temperature on coherent resonant transport in single electron tunneling regime

Applied Physics Letters

Volumn 69, Issue 3, 1996, Pages 406-408

  Wang, T H ^a   Tarucha, S ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001245865     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118076     Document Type: Article

References (12)

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