Continuous highly charged ion beams from the National Institute of Standards and Technology electron-beam ion trap

Review of Scientific Instruments

Volumn 68, Issue 5, 1997, Pages 1998-2002

  Ratliff, L P ^a   Bell, E W ^a,b   Parks, D C ^a   Pikin, A I ^a,c   Gillaspy, J D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Diamond Semiconductor Group   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001245471     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148087     Document Type: Article

References (18)

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