Giant magnetoresistance in Co/Cu multilayers: Influence of Co thickness at the first antiferromagnetic maximum

Journal of Applied Physics

Volumn 79, Issue 9, 1996, Pages 7395-7397

  Kubinski, D J ^a   Holloway, H ^a  

^a FORD RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001242805     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362449     Document Type: Article

References (14)

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4. Co on the properties of Co/Cu MLs at the second AFM has been described by A. M. Shukh, D. H. Shin, and H. Hoffmann, J. Appl. Phys. 76, 6507 (1994) , and by Kyeong-Ik Min and Seung-Ki Joo, J. Appl. Phys. 75, 4632 (1994).
5. Co on the properties of Co/Cu MLs at the second AFM has been described by A. M. Shukh, D. H. Shin, and H. Hoffmann, J. Appl. Phys. 76, 6507 (1994) , and by Kyeong-Ik Min and Seung-Ki Joo, J. Appl. Phys. 75, 4632 (1994).
6. D. J. Kubinski and H. Holloway, J. Appl. Phys. 79, 1661 (1996).
7. These measurements were made by Princeton Measurement Corporation.
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11. Co sufficiently for this effect to be evident.
12. S. K. J. Lenczowski, M. A. M. Gijs, J. B. Giesbers, R. J. M. van de Veerdonk, and W. J. M. de Jonge, Phys. Rev. B 50, 9982 (1994).
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14. Cu slightly away from this value.