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Journal of Applied Physics

Volumn 57, Issue 8, 1985, Pages 2830-2839

High-field and current-induced positive charge in thermal SiO2 layers

(3) Nissan Cohen, Y a Shappir, J a Frohman Bentchkowsky, D a

a HEBREW UNIVERSITY OF JERUSALEM (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001242030 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.335219 Document Type: Article

Times cited : (107)

References (39)

1
- 0017532603
- (1977) J. Vac. Sci. Technol. , vol.14 , pp. 1122
- Solomon, P.¹

2
- 0001368234
- (1974) J. Electrochem. Soc. , vol.119 , pp. 597
- Osborn, C.M.¹ Ormond, D.W.²

3
- 0016409643
- (1976) J. Vac. Sci. Technol. , vol.13 , pp. 50
- Distefano, T.H.¹ Shatzkes, M.²

4
- 0016973174
- (1976) J. Appl. Phys. , vol.47 , pp. 3192
- Shatzkes, M.¹ Av‐Ron, M.²

5
- 0016619857
- (1975) Solid State Commun. , vol.17 , pp. 1397
- Solomon, P.¹ Klein, N.²

6
- 0020832117
- (1983) J. Appl. Phys. , vol.54 , pp. 5793
- Nissan‐Cohen, Y.¹ Shappir, J.² Frohman‐Bentchkowsky, D.³

7
- 84950557457
- (1976) J. Appl. Phys. , vol.47 , pp. 1802
- Woods, M.H.¹ Williams, R.²

8
- 0016883932
- (1976) J. Appl. Phys. , vol.47 , pp. 248
- Weinberg, Z.A.¹ Johnson, W.C.² Lampert, M.A.³

9
- 0016871464
- (1976) J. Electrochem. Soc. , vol.123 , pp. 42
- Gdula, R.A.¹

10
- 0018531802
- (1979) J. Appl. Phys. , vol.50 , pp. 6366
- Young, D.R.¹ Irene, E.A.² Dimaria, D.J.³ Dekeersmaecker, R.F.⁴ Massoud, H.Z.⁵

11
- 0018063912
- edited by S. T. Pantelides (Pergamon, New York)
- (1978) The Physics of [formula omitted] and its Interfaces , pp. 24
- Weinberg, Z.A.¹ Rubloff, G.W.²

12
- 0018517937
- (1979) J. Appl. Phys. , vol.50 , pp. 5757
- Weinberg, Z.A.¹ Young, D.R.² Dimaria, D.J.³ Rubloff, G.W.⁴

13
- 0019622395
- (1981) J. Appl. Phys. , vol.52 , pp. 6231
- Lai, S.K.¹ Young, D.R.²

14
- 0019612331
- (1981) J. Appl. Phys. , vol.52 , pp. 5665
- Feigl, F.J.¹ Young, D.R.² Dimaria, D.J.³ Lai, S.⁴ Calise, J.⁵

15
- 0016337175
- (1974) Solid State Electron. , vol.17 , pp. 1229
- Breed, B.J.¹

16
- 30844473349
- (1975) Appl. Phys. Lett. , vol.26 , pp. 116
- Breed, B.J.¹

17
- 36749106479
- (1977) Appl. Phys. Lett. , vol.31 , pp. 215
- Solomon, P.M.¹ Eitken, J.M.²

18
- 0014564381
- (1969) J. Appl. Phys. , vol.40 , pp. 3887
- O’Dwyer, J.J.¹

19
- 0017679232
- (1977) J. Appl. Phys. , vol.48 , pp. 5217
- Kashat, I.¹ Klein, N.²

20
- 0001514594
- (1974) Appl. Phys. Lett. , vol.25 , pp. 685
- Distefano, T.H.¹ Shatzkes, M.²

21
- 0016006161
- (1975) J. Vac. Sci. Technol. , vol.12 , pp. 37
- Distefano, T.H.¹ Shatzkes, M.²

22
- 0017005888
- (1976) J. Appl. Phys. , vol.47 , pp. 4364
- Klein, N.¹ Solomon, P.²

23
- 84950557465
- Eiendhoven, April
- (1983) Proc. Inter. Conf. on Insulating Films on Semiconductors (INFOS 83)
- Hillen, M.W.¹ Dekeersmaecker, R.F.² Heyns, M.M.³ Hayood, S.K.⁴ Darakchiev, I.S.⁵

24
- 84950562785
- (1983) J. Electrochem. Soc. , vol.130 , pp. 1395
- Radojcic, R.¹

25
- 0021374432
- (1984) Appl. Phys. Lett. , vol.44 , pp. 417
- Nissan‐Cohen, Y.¹ Shappir, J.² Frohman‐Bentchkowsky, D.³

26
- 0020193389
- (1982) J. Appl. Phys. , vol.53 , pp. 7104
- Lai, S.K.¹

27
- 36749121891
- (1982) Appl. Phys. Lett. , vol.40 , pp. 523
- Eitan, B.¹ Frohman‐Bentchkowsky, D.² Shappir, J.³ Balog, M.⁴

28
- 84950557464
- International Electron Device Meeting, Washington
- (1983) , pp. 182
- Nissan‐Cohen, Y.¹ Shappir, J.² Frohman‐Bentchkowsky, D.³

29
- 33747713191
- (to be published)
- Solid State Electron.
- Nissan‐Cohen, Y.¹ Shappir, J.² Frohman‐Bentchkowsky, D.³

30
- 0018008204
- (1978) J. Appl. Phys. , vol.49 , pp. 4868
- Shatzkes, M.¹

31
- 0016993952
- (1976) J. Appl. Phys. , vol.47 , pp. 4073
- Dimaria, D.J.¹

32
- 84950526791
- (1982) Sov. Tech. Phys. Lett. , vol.8 , pp. 611
- Nagin, A.P.¹ Tyul’kin, V.M.²

33
- 3142747821
- (1982) Appl. Phys. Lett. , vol.40 , pp. 396
- Badihi, A.¹ Eitan, B.² Nissan‐Cohen, Y.³ Shappir, J.⁴

34
- 0018443532
- (1979) J. Appl. Phys. , vol.50 , pp. 1422
- Ferry, D.K.¹

35
- 0019912717
- (1982) Phys. Status Solidi A , vol.69 , pp. 349
- Fitting, H.J.¹ Frieman, J.U.²

36
- 4243375282
- (1983) Phys. Rev. Lett. , vol.50 , pp. 750
- Theis, T.N.¹ Kirtley, J.R.² Dimaria, D.J.³ Dong, D.W.⁴

37
- 4143049390
- (1984) Phys. Rev. Lett. , vol.52 , pp. 1445
- Theis, T.N.¹ Dimaria, D.J.² Kirtley, J.R.³ Dong, D.W.⁴

38
- 0020293801
- (1982) IEEE Trans. on Nucl. Sci. , vol.NS‐29 , pp. 1471
- Kroll, M.¹ Brounig, D.² Fahrner, W.R.³

39
- 0021463926
- (1984) J. Appl. Phys. , vol.56 , pp. 575
- Fischetti, M.V.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.