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Volumn 59, Issue 15, 1999, Pages 9741-9744

High-temperature ac conductivity of amorphous (formula presented) fused silica and thin thermal films

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EID: 0001225445     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.9741     Document Type: Article
Times cited : (17)

References (29)
  • 13
    • 0342949465 scopus 로고
    • G. Barbottin, A. Vapaille, Elsevier, Amsterdam, and, in, edited by, and, p
    • M. W. Hillen and J F. Verwey, in Instabilities in Silicon Devices, edited by G. Barbottin and A. Vapaille (Elsevier, Amsterdam, 1986), p. 403.
    • (1986) Instabilities in Silicon Devices , pp. 403
    • Hillen, M.W.1    Verwey, J.F.2
  • 18
    • 85037878556 scopus 로고    scopus 로고
    • Semiconductor Industry Association 1997 Report (Sewatech, Austin, TX, 1997)
    • The National Technology Roadmap for Semiconductors Technology Needs, Semiconductor Industry Association 1997 Report (Sewatech, Austin, TX, 1997).
  • 24
    • 85037889253 scopus 로고    scopus 로고
    • (Noyes, Park Ridge, NJ, 1993)
    • Handbook of Semiconductor Wafer Cleaning Technology (Noyes, Park Ridge, NJ, 1993).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.