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Volumn 38, Issue 11, 1988, Pages 7554-7557
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Chemical trend in silicide electronic structure and Schottky-barrier heights of silicide-silicon interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001225020
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.38.7554 Document Type: Article |
Times cited : (16)
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References (32)
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