Evaluation of the energy-transfer rate between an Er 4 f shell and a Si host in Er-doped Si

Journal of Applied Physics

Volumn 84, Issue 8, 1998, Pages 4471-4478

  Taguchi, A ^a   Takahei, K ^a,c   Matsuoka, M ^b   Tohno, S ^b  

^a NTT Basic Research Laboratories   (Japan)

^b NTT CORPORATION   (Japan)

^c ANRITSU CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001210701     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368673     Document Type: Review

References (21)

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19. Under the earlier measurement conditions used in Fig. 6, the signals obtained by detecting at 1400 and 1500 nm were of the noise level. Therefore, the background can be neglected in the measurement in Fig. 6.
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