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note
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The ethylene adduct has to date been the most amenable to study by X-ray diffraction. Four of the characteristic lines for the ethylene adduct are as follows, with d in Å (% intensity): 6.274 (100), 5.595 (70), 3.646 (15), and 3.046 (70), which can be indexed to a tetragonal cell a = b = 6.299(3) Å and c = 11.99(1) Å. Lines consistent with a √2 × √2 superstructure are observed upon longer exposure to ethylene.
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