Electrical resistivity of a thin metallic film

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 23, 1999, Pages 15782-15789

  Levy, P ^b  

^a UNIVERSITY OF SAN FRANCISCO   (United States)

^b NEW YORK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001198047     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.15782     Document Type: Article

References (12)

1. C. Blaas, P. Weinberger, L. Szunyogh, P M. Levy, C B. Sommers, and I. Mertig, Philos. Mag. B78, 549 (1998);
2. P. Weinberger, P M. Levy, J. Banhart, L. Szunyogh, and B. Ujfalussy, J. Phys.: Condens. Matter8, 7677 (1996).
3. C. Blaas, P. Weinberger, L. Szunyogh, P M. Levy, and C B. Sommers, Phys. Rev. B60, 492 (1999). The resistivities quoted in this publication should all be increased by a factor of four, P. Weinberger (private communication). Therefore the quoted resistivity for copper embedded in copper of 29/M μΩ cm should read 116/M μΩ cm.
4. S. Doniach and E H. Sondheimer, Green’s Functions for Solid State Physicists (Benjamin, Reading, MA, 1974).
5. E. H. Sondheimer, Adv. Phys.1, 1 (1952).
6. H. E. Camblong, Phys. Rev. B51, 1855 (1995).
7. S. Datta, Electronic Transport in Mesoscopic Systems (Cambridge University Press, Cambridge, England, 1995).
8. R. Kubo, J. Phys. Soc. Jpn.12, 570 (1957).
9. G. D. Mahan, Many-Particle Physics, 2nd ed. (Plenum, New York, 1990).
10. F. Seitz, The Modern Theory of Solids (McGraw-Hill, New York, 1940), pp. 369–370;
11. the approximate values given for (formula presented) and (formula presented) are, respectively, 7 and 2 eV.
12. G. D. Mahan, Many-Particle Physics (Ref. 8), pp. 602–606.