SCOPUS 정보 검색 플랫폼

Volumn 521, Issue , 2000, Pages 188-193

A time-resolved X-ray scattering experiment for the study of phase transitions and crystallization processes in metallic alloys

(11) Pelletier, J F a Sutton, M a Altounian, Z a Saini, S b Lurio, L B b Sandy, A R b Lumma, D b Borthwick, M A b Falus, P b Mochrie, S G J b Stephenson, G B c

a MCGILL UNIVERSITY (Canada)

b Massachusetts Institute of Technology Cambridge (United States)

c ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; ALUMINUM METALLOGRAPHY; NICKEL METALLOGRAPHY; SYNCHROTRON RADIATION; SYNCHROTRONS; TERNARY ALLOYS; X RAY SCATTERING; YTTRIUM ALLOYS; YTTRIUM METALLOGRAPHY;

ADVANCED PHOTON SOURCE; BERYLLIUM WINDOWS; CRYSTALLIZATION PROCESS; DIODE DETECTORS; HIGH RESOLUTION; METALLIC ALLOYS; TIME-RESOLVED; TIME-RESOLVED X-RAY SCATTERING;

X RAY DETECTORS;

EID: 0001195353 PISSN: 0094243X EISSN: 15517616 Source Type: Conference Proceeding
DOI: 10.1063/1.1291783 Document Type: Conference Paper

Times cited : (4)

References (10)

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2
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5
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