Chemically sensitive surface acoustic wave devices employing a self-assembled composite monolayer film: Molecular specificity and effects due to self-assembled monolayer adsorption time and gold surface morphology

Langmuir

Volumn 12, Issue 9, 1996, Pages 2239-2244

  Thomas, Ross C ^a   Yang, Huey C ^b   DiRubio, Chris R ^a   Ricco, Antonio J ^a   Crooks, Richard M ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001191134     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la950498w     Document Type: Article

References (58)

1. (a) Hughes, R. C.; Ricco, A. J.; Butler, M. A.;Martin, S. J. Science 1991, 254, 74.
2. (b) Grate, J. W.; Martin, S. J.; White, R. M. Anal. Chem. 1993, 65, 940A, 987A.
3. (c) Ward, M. D.; Buttry, D. A. Science 1990, 249, 1000.
4. (d) Ballantine, Jr., D. S.; Wohltjen, H. Anal. Chem. 1989, 61, 704A.
5. Ballantine, D. S., Jr.; Rose, S. L.; Grate, J. W.; Wohltjen, H. Anal. Chem. 1986, 58, 3058.
6. Bott, B.; Jones, T. A. Sens. Actuators 1986, 9, 19.
7. Carey, W. P.; Beebe, K. R.; Kowalski, B. R. Anal. Chem. 1987, 59, 1529.
8. Stetter, J. R.; Findlay, M. W.; Maclay, G. J. Sens. Actuators, B 1990, 1, 43.
9. Homer, G.; Hierold, Chr. Sens. Actuators, B 1990, 2, 173.
10. Schierbaum, K. D.; Weimar, U.; Göpel, W. Sens. and Actuators, B 1990, 2, 71.
11. Müller, R. Sens. Actuators, B 1991, 4, 35.
12. Nakamoto, T.; Fukuda, A.; Moriizumi, T.; Asakura, Y. Sens. Actuators, B 1991, 3, 221.
13. Winquist, F.; Sundgren, H.; Hedborg, E.; Spetz, A.; Lundström, I. Sens. Actuators, B 1992, 6, 157.
14. Shurmer, H. V.; Gardner, J. W. Sens. Actuators, B 1992, 8, 1.
15. Davide, F. A. M.; D'Amico, A. Sens. Actuators, A 1992, 32, 507.
16. Schmautz, A. Sens. Actuators, B 1992, 6, 38.
17. Zellers, E. T.; Patrash, S. J. Anal. Chem. 1992, 65, 2055.
18. Ricco, A. J.; Xu, C.; Crooks, R. M.; Allred, R. E. In Interfacial Design and Chemical Sensing; ACS Symposium Series No. 561; American Chemical Society: Washington, DC, 1994; Chapter 23, pp 264-279.
19. Kepley, L. K.; Crooks, R. M.; Ricco, A. J. Anal. Chem. 1992, 64, 3191.
20. (a) Ebersole, R. C.; Miller, J. A.; Moran, J. R.; Ward, M. D. J. Am. Chem. Soc. 1990, 112, 3239.
21. (b) Mirken, C. A.; Wrighton, M. S. J. Am. Chem. Soc. 1990, 112, 8596.
22. (c) Steinberg, S.; Rubinstein, I. Langmuir 1992, 8, 1183.
23. (a) Nuzzo, R. G.; Allara, D. L. J. Am. Chem. Soc. 1983, 105, 4481. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321, and references therein.
24. (a) Nuzzo, R. G.; Allara, D. L. J. Am. Chem. Soc. 1983, 105, 4481. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321, and references therein.
25. (b) Dubois, L. H.; Nuzzo, R. G. Annu. Rev. Phys. Chem. 1992, 43, 437 and references therein.
26. Thomas, R. C.; Houston, J. E.; Crooks, R. M.; Kim, T.; Michalske, T. A. J. Am. Chem. Soc. 1995, 117, 3830.
27. Frisbie, C. D.;Rozsnayai,L. F.;Noy, A.; Wrighton,M. S.; Lieber, C. M. Science 1994, 266, 771.
28. Thomas, R. C.; Tangyunyong, P.; Houston, J. E.; Michalske, T. A.; Crooks, R. M. J. Phys. Chem. 1994, 98, 4493.
29. (a) Sun, L.; Thomas, R. C.; Crooks, R. M.; Ricco, A. J. J. Am. Chem. Soc. 1991, 113, 8550.
30. (b) Sun, L.; Kepley, L. J.; Crooks, R. M. Langmuir 1992, 8, 2101.
31. (c) Sun, L.; Crooks, R. M.; Ricco, A. J. Langmuir 1993, 9, 1775.
32. Duevel, R. V.; Corn, R. M. Anal. Chem 1992, 64, 337.
33. Guo, L.-H.; Facci, J. S.; McLendon, G.; Mosher, R. Langmuir 1994, 10, 4588.
34. Creager, S. E.; Hockett, L. A.; Rowe, G. K. Langmuir 1992, 8, 854.
35. Fenter, P.; Eisenberger, P.; Liang, K. S. Phys. Rev. Lett. 1993, 70, 2447.
36. Camillone, N., III; Chidsey, C. E. D.; Eisenberger, P.; Fenter, P.; Li, J.; Liang, K. S.; Liu, G.-Y.; Scoles, G. J. Phys. Chem. 1993, 99, 744.
37. Poirier, G. E.; Tarlov, M. J. J. Phys. Chem. 1995, 99, 10960.
38. Ricco, A. J.; Frye, G. C.; Martin, S. J. Langmuir 1989 5, 273.
39. (a) Martin, S. J.; Frye, G. C. Poc. 1991 Ultrasonics Symposium; IEEE: New York, 1991; pp 393-398.
40. (b) Martin, S. J.; Frye, G. C.; Senturia, S. D. Anal. Chem. 1994, 66, 2201.
41. (c) Martin, S. J.; Frye, G. C. Appl. Phys. Lett. 1990, 57, 1867.
42. (d) Martin, S. J.; Ricco, A. J. Sens. Actuators 1990, A22, 712.
43. Thomas, R. C.; Sun, L.; Crooks, R. M.; Ricco, A. J. Langmuir 1991, 7, 620.
44. Wagner-Jauregg, T.; Hackley, B. E., Jr.; Lies, T. A.; Owens, O. O.; Proper, R. J. J. Am. Chem. Soc. 1955, 77, 922.
45. Ashcroft, N. W.; Mermin, N, D. Solid State Physics; Saunders College, 1976; Chapter 4, p. 63.
46. Golan, Y.; Margulis, L.; Rubinstein, I. Surf. Sci. 1992, 264, 312.
47. Ricco, A. J.; Martin, S. J. Thin Solid Films 1992, 206, 94.
48. Martin, S. J.; Ricco, A. J.; Ginley, D. S.; Zipperian, T. E. IEEE Trans. UFFC, 1987, UFFC-34, 142.
49. The average grain size of the Au SAW transducers, which were prepared over a Ti adhesion layer, was initially 60 nm (approximately the same as the ones evaporated at room temperature with no adhesion layer). Thermal annealing the devices up to 300 °C caused the grain size to increase by no more than 35%.
50. Grate, J. W.; Klusty, M.; McGill, R. A.; Abraham, M. H.; Whting, G.; Andonian-Haftvan, J. Anal. Chem. 1992, 64, 610.
51. Thomas, R. C.; et al. Manuscript in preparation.
52. Yang, H. C.; McEllistrem, L.; Ricco, A. J.; Crooks, R. M. Manuscript in preparation.
53. Smith, E. L.; Alves, C. A.; Anderegg, J. W.; Porter, M. D. Langmuir 1992, 8, 2707.
54. Camillone, N., III; Eisenberger, P.; Leung, T. Y. B.; Schwartz, P.; Scoles, G.; Poirier, G. E.; Tarlov, M. J. J. Phys. Chem. 1994, 101, 11031.
55. Nuzzo, R. G.; Dubois, L. H.; Allara, D. L. J. Am. Chem. Soc. 1990, 112, 558.
56. Chidsey, C. E. D.; Loiacono, D. N. Langmuir 1990, 6, 682.
57. Ellipsometric measurements were done using a Gaertner Model L2W26D.488 ellipsometer with a He-Ne laser at a 70% angle of incidence and a 45% azimuth of the quarter-wave compensator. Film thicknesses were calculated by using a real refractive index of 1.45, the complex refractive index of a similarly prepared naked Au substrate, and an algorithm developed at Sandia National Laboratories (Tardy, H. L. ELLIPSE User's Manual and Program Reference; Report No. 89-0008; Sandia National Laboratories: Albuquerque, NM, 1989).
58. There are instances, notably when the adsorption substrate is porous, in which complete thermodynamic equilibrium can be maintained throughout an isotherm, even though the adsorption and desorption branches differ significantly. This is a consequence of the different radii of curvature that pertain if the meniscus of layers of adsorbate coating the walls of pores is cylindrical (during filling) or spherical (during emptying): Adamson, A. W. Physical Chemistry of Surfaces, 4th ed.; John Wiley & Sons: New York, 1982; pp 584-589. We do not believe there is sufficient porosity in the present instance to support this phenomenon, but we cannot unequivocally rule it out.