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Volumn 71, Issue 13, 1993, Pages 2082-2085
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Real-time observations of vacancy diffusion on Si(001)-(2×1) by scanning tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001187444
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.71.2082 Document Type: Article |
Times cited : (124)
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References (23)
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