Infrared reflectance of thick p-type porous SiC layers

Journal of Applied Physics

Volumn 80, Issue 4, 1996, Pages 2412-2419

  MacMillan, M F ^a   Devaty, R P ^a   Choyke, W J ^a   Goldstein, D R ^b   Spanier, J E ^b   Kurtz, A D ^b  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b Kulite Semiconductor Products Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001183721     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363046     Document Type: Article

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