Quantitative determination of the order parameter in epitaxial layers of ZnSnP2

Applied Physics Letters

Volumn 76, Issue 15, 2000, Pages 2017-2019

  Francoeur, S ^a   Seryogin, G A ^a   Nikishin, S A ^a   Temkin, H ^a  

^a Texas Tech University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001181271     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126240     Document Type: Article

References (16)

1. A. Zunger and S. Mahajan, Handbook Semicond. 3, 1399 (1994).
2. M. C. Ohmer and R. Pandey, MRS Bull. 23, 16 (1998).
3. C. S. Baxter, R. F. Broom, and W. M. Stobbs, Surf. Sci. 228, 102 (1990).
4. D. Mao, P. C. Taylor, S. R. Kurtz, M. C. Wu, and W. A. Harrison, Phys. Rev. Lett. 76, 4769 (1996).
5. P. Ernst, C. Geng, F. Scholz, and H. Schweizer, Y. Zhang, and A. Mascarenhas, Appl. Phys. Lett. 67, 2347 (1995).
6. D. Chipman and B. E. Warren, J. Appl. Phys. 21, 696 (1950).
7. B. E. Warren, X-ray Diffraction (Addison-Wesley, Reading, MA, 1969), pp. 61, 209, 216.
8. D. R. Chipman, J. Appl. Phys. 27, 739 (1956).
9. R. L. Forrest, T. D. Golding, S. C. Moss, Z. Zhang, J. F. Geisz, J. M. Olson, A. Mascarenhas, P. Ernst, and C. Geng, Phys. Rev. B 58, 15 355 (1998).
10. W. J. Bartels, J. Hornstra, and D. J. W. Lobeek, Acta Cryst. A 42, 539 (1986).
11. S. Francoeur, G. A. Seryogin, S. A. Nikishin, and H. Temkin, Appl. Phys. Lett. 74, 3678 (1999).
12. G. A. Seryogin, S. A. Nikishin, H. Temkin, A. M. Mintairov, J. L. Merz, and M. Holtz, Appl. Phys. Lett. 74, 2128 (1999).
13. International Tables for X-ray Crystallography (Kynoch, Birmingham, England, 1962), Vol. 3.
14. S. C. Abrahams and F. S. L. Hsu, J. Chem. Phys. 63, 1162 (1975).
15. 3Au [J. M. Cowley, Phys. Rev. 77, 667 (1950)], but specific to the chalcopyrite structure.
16. 3Au [J. M. Cowley, Phys. Rev. 77, 667 (1950)], but specific to the chalcopyrite structure.