[Ni(C10H8N2)3] 2[V4O12].11H2O

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 5, 1998, Pages 616-618

  Yang, Guo Yu ^a   Gao, Da Wei ^a   Chen, Ying ^a   Xu, Ji Qing ^a   Zeng, Qing Xin ^a   Sun, Hao Ran ^a   Pei, Zhi Wu ^b   Su, Qiang ^b   Xing, Yan ^b   Ling, Yong Hua ^b   Jia, Heng Qing ^b  

^a JILIN UNIVERSITY   (China)

^b CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001178520     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270197018751     Document Type: Article

References (9)

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4. North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.
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6. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
7. Siemens (1990). SHELXTL-Plus. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
8. Siemens (1994). XSCANS Users Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
9. Zhang, Y., Zapf, P. J., Meyer, L. M., Haushalter, R. C. & Zubieta, J. (1997). Inorg. Chem. 36, 2159-2165.