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Volumn 188, Issue 1-2, 1987, Pages 181-198
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Novel aspects of mid and far IR Fourier spectroscopy applied to surface and adsorption studies on SiO2
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001172954
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(87)80150-4 Document Type: Article |
Times cited : (228)
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References (32)
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