Freely migrating defects in ion-irradiated Cu3Au

Applied Physics Letters

Volumn 75, Issue 6, 1999, Pages 805-807

  Wei, L C ^a   Lang, E ^a   Flynn, C P ^a   Averback, R S ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001172424     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124519     Document Type: Article

References (16)

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