In-situ spectroscopic ellipsometry of HgCdTe

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1406-1410

  Benson, J D ^a   Cornfeld, A B ^a   Martinka, M ^a   Singley, K M ^a   Derzko, Z ^a   Shorten, P J ^a   Dinan, J H ^a   Boyd, P R ^b   Wolfgram, F C ^b   Johs, B ^c   He, P ^c   Woollam, John A ^c  

^a NIGHT VISION AND ELECTRONIC SENSORS DIRECTORATE   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

^c J A WOOLLAM CO INC   (United States)

Author keywords

Molecular beam epitaxy; Spectroscopic ellipsometry

Indexed keywords

EID: 0001167931     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655042     Document Type: Article

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