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Volumn 70, Issue 8, 1999, Pages 3259-3264

Repetitively sampled time-of-flight mass spectrometry for gas-phase kinetics studies

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001164908     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149944     Document Type: Article
Times cited : (24)

References (8)
  • 6
    • 0041515548 scopus 로고
    • Ion Source Software, KLACK Inc., Idaho Falls, Idaho
    • D. A. Dahl, Simion 3D, 6.0 ed. (Ion Source Software, KLACK Inc., Idaho Falls, Idaho, 1995).
    • (1995) Simion 3D, 6.0 Ed.
    • Dahl, D.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.