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Volumn 122, Issue 2, 1995, Pages 348-366

A level set approach to a unified model for etching, deposition, and lithography II: Three-dimensional simulations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001163571     PISSN: 00219991     EISSN: 10902716     Source Type: Journal    
DOI: 10.1006/jcph.1995.1221     Document Type: Article
Times cited : (108)

References (44)
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    • (1993) Optical/Laser Microlithography VI, SPIE , vol.19 , pp. 382-394
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    • Scheckler, E.W.1
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    • 85027614257 scopus 로고    scopus 로고
    • Algorithms for Tracking Interfaces in CFD and Material Science
    • Wiley, New York
    • J. A. Sethian, “Algorithms for Tracking Interfaces in CFD and Material Science,” in Computational Fluid Dynamics Review (Wiley, New York, 1995).
    • Computational Fluid Dynamics Review , pp. 1995
    • Sethian, J.A.1
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    • J. A. Sethian, Ph.D. dissertation, Mathematics, University of California, Berkeley, 1982 (unpublished).
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  • 37
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    • Sethian, J.A.1
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    • K. K. H. Toh, Ph.D. dissertation, EECS, University of California, Berkeley, 1990 (unpublished).
    • (1990)
    • Toh, K.K.H.1
  • 43
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    • Extension of the Hopkins Theory of Partially Coherent Imaging to Include Thin- Film Interference Effects
    • M. S. Young, D. Lee, R. Lee, and A. R. Neureuther, “Extension of the Hopkins Theory of Partially Coherent Imaging to Include Thin- Film Interference Effects,” in Proc. SPIE Optical/Laser Microlithography VI, 1993, Vol. 1927, p. 452.
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    • Young, M.S.1    Lee, D.2    Lee, R.3    Neureuther, A.R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.