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Volumn 68, Issue 8, 1996, Pages 1102-1104

Electrical detection of electron nuclear double resonance in silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001159824     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115726     Document Type: Review
Times cited : (23)

References (22)
  • 4
    • 21544480645 scopus 로고    scopus 로고
    • S. Gruelich-Weber, Proceedings of the 17th International Conference, Defects in Semiconductors 17, Materials Science Forum Vol. 143-147, edited by H. Heinrich and W. Jantsch (Trans Tech, Aedersmannsdorf, Switzerland, 1993).
    • S. Gruelich-Weber, Proceedings of the 17th International Conference, Defects in Semiconductors 17, Materials Science Forum Vol. 143-147, edited by H. Heinrich and W. Jantsch (Trans Tech, Aedersmannsdorf, Switzerland, 1993).
  • 6
    • 21544451763 scopus 로고    scopus 로고
    • S. Gruelich-Weber, B. Stich, and J.-M. Spaeth, Proceedings of the 18th International Conference on Defects in Semiconductors, Sendai, Japan, 1995.
    • S. Gruelich-Weber, B. Stich, and J.-M. Spaeth, Proceedings of the 18th International Conference on Defects in Semiconductors, Sendai, Japan, 1995.
  • 9
    • 21544461596 scopus 로고    scopus 로고
    • L. S. Vlasenko and V. A. Khramtsov, Sov. Phys. Semicond. 20, 1986.
    • L. S. Vlasenko and V. A. Khramtsov, Sov. Phys. Semicond. 20, 1986.
  • 18
    • 21544461830 scopus 로고    scopus 로고
    • J.-M. Spaeth, J. R. Niklas, and R. H. Bartram, Structural Analysis of Point Defects in Solids, An Introduction to Multiple Magnetic Resonance Spectroscopy, Solid State Sciences Vol. 43 (Springer, Heidelberg, 1992).
    • J.-M. Spaeth, J. R. Niklas, and R. H. Bartram, Structural Analysis of Point Defects in Solids, An Introduction to Multiple Magnetic Resonance Spectroscopy, Solid State Sciences Vol. 43 (Springer, Heidelberg, 1992).
  • 22
    • 21544447606 scopus 로고    scopus 로고
    • L. S. Vlasenko, 20th International Conference on the Physics of Semiconductors, edited by E. M. Anastassakis and F. D. Joannopoulos (World Scientific, Singapore, 1990), Vol. 1, pp. 714-721.
    • L. S. Vlasenko, 20th International Conference on the Physics of Semiconductors, edited by E. M. Anastassakis and F. D. Joannopoulos (World Scientific, Singapore, 1990), Vol. 1, pp. 714-721.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.