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Volumn 50, Issue 21, 1987, Pages 1506-1508

Near threshold sputtering of Si and SiO2 in a Cl2 environment

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001153540     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.97814     Document Type: Article
Times cited : (56)

References (27)
  • 24
    • 84950580871 scopus 로고
    • Proceedings of the Meeting of The Electrochemical Society, San Diego,(to be published).
    • (1986)
    • Coburn, J.W.1    Köhler, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.