Grain boundary trap distribution in polycrystalline silicon thin-film transistors

Journal of Applied Physics

Volumn 73, Issue 8, 1993, Pages 4086-4088

  Dimitriadis, C A ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001152868     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.352836     Document Type: Article

References (9)