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Volumn 199, Issue 9, 1998, Pages 1973-1979

Tetrahexylsexithiophene: Crystal structure and molecular mechanics calculations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001141587     PISSN: 10221352     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3935(19980901)199:9<1973::AID-MACP1973>3.0.CO;2-6     Document Type: Article
Times cited : (35)

References (25)
  • 12
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instrument Inc., Madison, Wisconsin USA
    • G. M. Sheldrick, SHELXTL-Plus Release 4.1. Siemens Analytical X-ray Instrument Inc., Madison, Wisconsin USA (1990)
    • (1990) SHELXTL-Plus Release 4.1
    • Sheldrick, G.M.1
  • 25
    • 0000031462 scopus 로고    scopus 로고
    • and references therein
    • see e. g. A. Bolognesi, W. Porzio, F. Provasoli, T. Ezquerra, Makromol. Chem. 194, 817 (1993), or A. Bolognesi, W. Porzio, G. Zhuo, T. Ezquerra, Eur. Polym. J. 32, 1097 (1996) and references therein
    • (1996) Eur. Polym. J. , vol.32 , pp. 1097
    • Bolognesi, A.1    Porzio, W.2    Zhuo, G.3    Ezquerra, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.